Scanning Auger Microscopy Auger Electron Spectroscopy (AES) – Modular PHY system 

Nano SAM Lab S Scanning Auger Microscopy System (Omicron)

AFM/STM Microscopy System INNOVA 

X- Ray Diffractometer 

Spectroscopic ellipsometry 


    • Spectroscopic phase modulated ellipsometer UVISEL ER Bench top
      • Technical and operation level
        • Spectral Range : 190 – 2100 nm
        • Microspot optics: 0.05 – 0.1– 1.0 mm spot sizes
        • 200mm XY motorised stage
        • Automatic adjustable Goniometer.
        • Autocollimating system.
        • 150 W source
        • Low stray light level monochromator for FUV range measurement
        • High resolution monochromator with automatic slit adjustment ( better than 0.5 nm)
        • PMT based detection system for high dynamic range 
        • Film Thickness of transparent films: Up to 40µm 
        • Psi : 0-90° , Delta : 0-360° 
        • Real Time multitask window based software, including acquisition, modelling, and calibration.
        • Modelling and acquisition include Mueller Matrix measurement ( Minimum 11 elements )
        • The software runs modelling of data in parallel with the acquisition
      • Applications
        • Spectroscopic phase modulated ellipsometry measurements
        • Measuring very thin and/or highly transparent films
        • Measuring very thin films on transparent substrates
        • Analysis of liquids
        • Mapping analysis under various angles of incidence (40° -90° ) 

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Micro-Raman spectroscopy and Photoluminescence 

UV-VIS –NIR spectrophotometry

FTIR spectrophotometers

Hall effect measurement system by Van der Pauw method 
Set-up for Magneto-Optic Kerr Effect (MOKE)