Scanning Auger Microscopy Auger Electron Spectroscopy (AES) – Modular PHY system 

Nano SAM Lab S Scanning Auger Microscopy System (Omicron)

AFM/STM Microscopy System INNOVA 

X- Ray Diffractometer 

Spectroscopic ellipsometry 

• Spectroscopic phase modulated ellipsometer UVISEL ER Bench top
• Technical and operation level
• Spectral Range : 190 – 2100 nm
• Microspot optics: 0.05 – 0.1– 1.0 mm spot sizes
• 200mm XY motorised stage
• Automatic adjustable Goniometer.
• Autocollimating system.
• 150 W source
• Low stray light level monochromator for FUV range measurement
• High resolution monochromator with automatic slit adjustment ( better than 0.5 nm)
• PMT based detection system for high dynamic range 
• Film Thickness of transparent films: Up to 40µm 
• Psi : 0-90° , Delta : 0-360° 
• Real Time multitask window based software, including acquisition, modelling, and calibration.
• Modelling and acquisition include Mueller Matrix measurement ( Minimum 11 elements )
• The software runs modelling of data in parallel with the acquisition
• Applications
• Spectroscopic phase modulated ellipsometry measurements
• Measuring very thin and/or highly transparent films
• Measuring very thin films on transparent substrates
• Analysis of liquids
• Mapping analysis under various angles of incidence (40° -90° ) 

Read more here.

 

Micro-Raman spectroscopy and Photoluminescence 

UV-VIS –NIR spectrophotometry

• Jasco V-670 
• Lambda 1050 Perkin Elmer 

FTIR spectrophotometers

• Spectrum 100 Perkin Elmer with UATR accessory 
• Jasco FT-IR-6300 with ATR accessories

Hall effect measurement system by Van der Pauw method 
Set-up for Magneto-Optic Kerr Effect (MOKE)